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INTERFEROMETRISCHER POSITIONSSENSOR

Patentnummer:EP3535545B1
IPC Hauptklasse:G01B11/26
Anmelder:MBDA UK LTD (1)
Erfinder:CARTER CHRISTOPHER (1)
CARTER CHRISTOPHER RALPH (1)
CHRISTOPHER RALPH CARTER (1)
ROSS MATTHEW WILLIAMS (1)
WILLIAMS ROSS (1)
WILLIAMS ROSS MATTHEW (1)
Anmeldung:03.11.16
Patenterteilung:02.08.23
Einspruch bis:02.05.24

Abstract / Hauptanspruch
An interferometric position sensor for sensing the position of an object is disclosed. The position sensor comprises a light source arranged to emit light, a beam splitter, and a detector array. The beam splitter is arranged to split the light between first and second optical paths, which are configured such that the split light is recombined so as to form an optical interference pattern dependent on the difference between the optical path lengths of the first and second optical paths. The detector array is arranged to measure the intensity of at least a part of the optical interference pattern. At least one of the first and second optical path lengths is arranged to be dependent on the position of the object, such that changes in the optical interference pattern can be related to changes in the position of the object.


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