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ENDOSKOPISCHE VORRICHTUNG ZUR KONTAKTLOSEN MESSUNG

Patentnummer:EP3737285B1
IPC Hauptklasse:G01B11/25
Anmelder:UNIV BRUXELLES (1)
ユニヴェルシテ・リブレ・ドゥ・ブリュッセル (1)
Erfinder:DELCHAMBRE ALAIN (2)
DEVIERE JACQUES (2)
LEDUC DIMITRI (2)
MERTENS BENJAMIN (2)
PETRE MAXIME (2)
Anmeldung:10.01.18
Patenterteilung:09.08.23
Einspruch bis:09.05.24

Abstract / Hauptanspruch
Device (10) for non-contact measurement, comprising: a light source (18), a light pattern projector (17) comprising a diffractive optical element (173) optically coupled to the light source,an imaging system (16) configured for imaging a target site (8) illuminated by the light pattern projector, a support (15) to which the light pattern projector and the imaging system are attached in fixed relative positions,anda processing unit (12) configured to process data acquired by the imaging system.The support has a longitudinal axis (151) parallel to an optical axis (175) of the light pattern projector (17), wherein the light pattern projector (17) and the imaging system (16) are arranged at spaced apart positions along the longitudinal axis (151).The light source is operable to emit a plurality of light beams of different colours, each one of the plurality of light beams being a coherent beam optically coupled to the diffractive optical element (173). The diffractive optical element is configured to diffract the plurality of light beams according to different diffraction angles resulting in separate patterns. The processing unit is configured to determine a measurement based on at least two positions automatically recognised in data acquired from a single one of the separate patterns


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