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SYSTEM UND VERFAHREN ZUR QUALITÄTSPRÜFUNG AUFGRUND EINER MESSUNGEN

Patentnummer:EP3309504B1
IPC Hauptklasse:G01B11/00
Anmelder:GEN ELECTRIC (4)
Erfinder:ARVIND RANGARAJAN (1)
BALSAMO FRANCESCO (1)
BIANCHI LORENZO (1)
BOLINGER JOSEPH WILLIAM (1)
FRANCESCO BALSAMO (1)
JOSEPH WILLIAM BOLINGER (1)
LORENZO BIANCHI (1)
MURUGAPPAN SUNDAR (1)
RANGARAJAN ARVIND (1)
SUNDAR MURUGAPPAN (1)
Anmeldung:09.10.17
Patenterteilung:23.08.23
Einspruch bis:23.05.24

Abstract / Hauptanspruch
A method for inspecting a component includes generating measurement data of the component, using a measurement device coupled to an optical marker device 502. The method further includes generating co-ordinate data of the measurement device, using the optical marker device and at least one camera 504. The method includes generating synchronized measurement data based on the measurement data and the co-ordinate data 506. The method further includes retrieving pre-stored data corresponding to the synchronized measurement data, from a database 508. The method also includes generating feedback data based on the pre-stored data and the synchronized measurement data, using an augmented reality technique 510. The method includes operating the measurement device based on the feedback data to perform one or more measurements to be acquired from the component 512.


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