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HÖHENMESSUNGSVORRICHTUNG

Patentnummer:EP4036517B1
IPC Hauptklasse:G01B11/02
Anmelder:FUJI CORP (2)
株式会社FUJI (2)
Erfinder:AZUMA TAKUMI (1)
OISHI NOBUO (1)
Anmeldung:26.09.19
Patenterteilung:23.08.23
Einspruch bis:23.05.24

Abstract / Hauptanspruch
A height measurement device images a target loaded at a predetermined position of a loading surface, and extracts a contour of the target from a two-dimensional image of the imaged target. Subsequently, the height measurement device sets a circumscribed rectangular area of which each side is parallel to a corresponding side of the visual field of the camera and each side is circumscribed with the extracted contour of the target, and sets an extension area in which each of four sides of the set circumscribed rectangular area is extended outward by a predetermined amount. Next, the height measurement device determines multiple imaging positions such that maximum parallax is obtained within a range where the extension area does not protrude from the visual field of the camera. Then, the height measurement device images the target at each of the determined multiple imaging positions, and estimates a height of the target from parallax of a two-dimensional image of the target imaged at each of the multiple imaging positions.


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