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VORRICHTUNG ZUR MESSUNG DREIDIMENSIONALER FORMEN, VERFAHREN ZUR MESSUNG DREIDIMENSIONALER FORMEN, PROGRAMM UND AUFZEICHNUNGSMEDIUM
| Patentnummer: | EP3767227B1 |
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| IPC Hauptklasse: | G01B11/25 |
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| Anmelder: | NEC CORP (1)
日本電気株式会社 (1) |
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| Erfinder: | SAKAMOTO SHIZUO (0) |
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| Anmeldung: | 13.03.19 |
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| Patenterteilung: | 04.05.22 |
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| Einspruch bis: | 04.02.23 |
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Abstract / Hauptanspruch |
| A three-dimensional shape measuring apparatus includes: a single projector device that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; an image capture device that acquire an image of the measured object on which the first or second light pattern is projected; and an image processing device that processes the image acquired by the image capture device. The image processing device includes a relative phase value calculation unit that calculates a relative phase value on each part of the measured object based on a luminance value of an image of the measured object on which the first light pattern is projected, an absolute phase value calculation unit that calculates an absolute phase value on each part of the measured object based on a luminance value and the relative phase value of an image of the measured object on which the second light pattern is projected, and a three-dimensional coordinate calculation unit that calculates three-dimensional coordinates at each part of the measured object based on the absolute phase value. |
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