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HÖHENMESS- UND -SCHÄTZUNGSVERFAHREN DER UNEBENEN OBERFLÄCHE EINES OBJEKTTRÄGERS UND MIKROSKOP

Patentnummer:EP3385663B1
IPC Hauptklasse:G01B11/06
Anmelder:YIN, Yuefeng (1)
殷跃锋 (1)
Erfinder:YIN YEUFENG (2)
YIN YUEFENG (2)
Anmeldung:04.12.16
Patenterteilung:11.05.22
Einspruch bis:11.02.23

Abstract / Hauptanspruch
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard microscope slide is used as a template to obtain heights of all standard measurement points on another microscope slide to be measured. The method is realized through a conversion relationship of a functional equation set of coordinates and the heights. In the present invention, a height on a curved surface of any microscope slide can be measured accurately; and the method for measuring the height on the curved surface is applied to an automatic scanning microscope to realize fast micro image scan of samples on the microscope slide. Particularly under a high-magnification lens, advantages of high imaging definition, high scanning speed, high efficiency and automation are more outstanding.


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