patentverein.de - Patente
Patentethik
Überwachung
Beispielhaft
Trivial
Kurios
Unverständlich
Zurück Europäisches Patentamt

REGISTRIERUNG EINER ERWEITERTEN REFERENZ ZUR PARAMETERMESSUNG IN EINEM OPTISCHEN ERFASSUNGSSYSTEM

Patentnummer:EP3581878B1
IPC Hauptklasse:G01B11/16
Anmelder:INTUITIVE SURGICAL OPERATIONS (2)
LUNA INNOVATIONS INC (1)
Erfinder:BOS JOSEPH J (2)
FROGGATT MARK E (3)
GIFFORD DAWN K (4)
KLEIN JUSTIN W (2)
REAVES MATTHEW (2)
SANG ALEXANDER K (4)
Anmeldung:31.05.11
Patenterteilung:11.08.21
Einspruch bis:11.05.22

Abstract / Hauptanspruch
An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.


Kommentare zu diesem Patent schicken Sie bitte an
Datenschutzerklärung