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SYSTEM ZUR DREIDIMENSIONALEN MESSUNG MIT MEHRFACHMESSMODUS UND MESSVERFAHREN | SYSTÈME DE MESURE TRIDIMENSIONNELLE À MULTIPLES MODES DE MESURE ET PROCÉDÉ DE MESURE | MULTI-MEASUREMENT-MODE THREE-DIMENSIONAL MEASUREMENT SYSTEM AND MEASUREMENT METHOD

Patentnummer:EP3293481B1
IPC Hauptklasse:G01B001125
Anmelder:
Erfinder:
Anmeldung:27.07.16
Offenlegung:08.04.16
Patenterteilung:02.06.21

Abstract / Hauptanspruch
The present invention relates to the field of three-dimensional digital imaging, and more particularly to a three-dimensional measuring system and a measuring method with multiple measuring modes. The measuring system includes a control unit, a variable digital pattern generation unit, an image processing unit, a calculating unit and at least one image sensor; the control unit is adapted for controlling the cooperative work of the whole measuring system; the variable digital pattern generation unit includes a memory and a projector, and the memory stores a plurality of light template digital patterns; the image sensors are used for acquiring patterns which are projected onto a surface of a measured object; the image processing unit is a multi-mode digital image processor; and the calculating unit is a multi-mode three-dimensional point cloud calculator. The three-dimensional measuring system and the measuring method with multiple measuring modes of the present invention can implement the high-precision and high-detail three-dimensional measurement or handheld real-time measurement by switching the measuring modes, thereby having a wide application range.

EP3293481B1


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