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Europäisches Patentamt

Optische Positionsmessvorrichtung basierend auf der Projektion von Gittermustern | Appareil de mesure optique de la position basé sur la projection de motifs en forme de grille | Optical position measuring apparatus based on projection of grid patterns

Patentnummer:EP2161537B1
IPC Hauptklasse:G01B001125
Anmelder:
Erfinder:
Anmeldung:03.09.09
Offenlegung:05.09.08
Patenterteilung:28.10.20

Abstract / Hauptanspruch
A position measuring apparatus including a first irradiating part that irradiates a first beam to an object, a second irradiating part that irradiates a second beam to the object, a capturing part that captures images of the object, a processing part that generates a first difference image and a second difference image by processing the images captured by the capturing part, an extracting part that extracts a contour and a feature point of the object from the first difference image, a calculating part that calculates three-dimensional coordinates of a reflection point located on the object based on the second difference image, and a determining part that determines a position of the object by matching the contour, the feature point, and the three-dimensional coordinates with respect to predetermined modeled data of the object.



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