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Europäisches Patentamt

Optical measurement system

Patentnummer:US10794685B2
IPC Hauptklasse:G01B001102
Anmelder:OMRON CORPORATION (0)
Kyoto, JP
Erfinder:Suga, Takahiro (0)
Kyoto, JP
Takimasa, Hiroaki (0)
Kyoto, JP
Anmeldung:16.11.17
Offenlegung:23.02.17
Patenterteilung:06.10.20

Abstract / Hauptanspruch
An optical measurement system calculates a distance between an optical system and a measurement object based on reflected light beams corresponding to cores, compares a value indicating the distance with a threshold value for each of the reflected light beams, calculates an average value of all the values indicating the distance when the values in the reflected light beams corresponding to all the cores are equal to or greater than the threshold value or the values are less than the threshold value, and calculates an average value of the values indicating the distance which are equal to or greater than the threshold value or an average value of the values indicating the distance which are less than the threshold values when the values corresponding to some cores are equal to or greater than the threshold value and the values corresponding to the other cores are less than the threshold value.



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