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Europäisches Patentamt

Appearance inspection device, appearance inspection method and program

Patentnummer:US10794691B2
IPC Hauptklasse:G01B001125
Anmelder:OMRON CORPORATION (0)
Kyoto, JP
Erfinder:
Anmeldung:16.01.19
Offenlegung:13.03.18
Patenterteilung:06.10.20

Abstract / Hauptanspruch
An appearance inspection device that can easily determine optimum values of various imaging parameters is provided. An appearance inspection device includes: a moving means which changes relative positions of at least two or more portions within a work-piece, an imaging part, and an illumination part; an imaging processing part which performs, in a state that the illumination part irradiates a light to the work-piece, a processing for changing imaging parameters and taking a plurality of images by the imaging part under a condition that plural types of imaging parameters with mutually different properties are variably set, the plural types of imaging parameters including a change of the relative position between the work-piece and the imaging part caused by the moving means; and a parameter determining part determining a set of optimum values of the plural types of imaging parameters that are set variably based on the plurality of taken images.



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