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Europäisches Patentamt

Methods for improving the accuracy of dimensioning-system measurements

Patentnummer:US10775165B2
IPC Hauptklasse:G01B001102
Anmelder:
Erfinder:
Anmeldung:02.10.15
Offenlegung:10.10.14
Patenterteilung:15.09.20

Abstract / Hauptanspruch
Methods to improve the accuracy of non-contact measurements of an object's dimensions using a dimensioning system are disclosed. The methods include a method for creating a mathematical model (i.e., error model) based on an observed correlation between errors in an estimated dimension and the characteristics of the measurement used to obtain the estimated dimension. These error models may be created for various dimensions and stored for future use. The methods also include a method for using the stored error models to reduce the error associated with a particular dimensioning-system measurement. Here an error model is used to create an estimated error. The estimated error is then removed from the estimate of the dimension to produce a final estimate of the dimension that is more accurate.

US10775165B2


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