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DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT MEASURING METHOD | WEGMESSVORRICHTUNG, MESSSYSTEM UND WEGMESSVERFAHREN | DISPOSITIF DE MESURE DE DÉPLACEMENT, SYSTÈME DE MESURE ET PROCÉDÉ DE MESURE DE DÉPLACEMENT

Patentnummer:EP3460387B1
IPC Hauptklasse:G01B001106
Anmelder:OMRON CORPORATION (0)
Kyoto, JP
Erfinder:
Anmeldung:09.02.18
Offenlegung:26.09.17
Patenterteilung:13.05.20

Abstract / Hauptanspruch
A displacement measuring device capable of accurately measuring a distance (L1(i), L2(i), L3(i), L4(i)) to a measurement target surface is provided. The displacement measuring device includes a light projecting part generating light, a sensor head irradiating a measurement target with the light and receiving light of the irradiated light reflected by a measurement target surface of the measurement target, and a control part calculating a value indicating a distance (L1(i), L2(i), L3(i), L4(i)) to the measurement target surface on the basis of the light received by the sensor head. The control part processes the calculated value as the value indicating the distance (L1(i), L2(i), L3(i), L4(i)) to the measurement target surface on condition that the calculated value is included in a preset numerical range (Rl(i), R2(i), R3(i), R4(i)) and resets the preset numerical range (R1(i), R2(i), R3(i), R4(i)) on the basis of the calculated value.

EP3460387B1


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