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Inspection template and method of inspecting a component | Inspektionsvorlage und Verfahren zur Inspektion einer Komponente | Gabarit d'inspection et procédé d'inspection de composant

Patentnummer:EP2610578B1
IPC Hauptklasse:G01B000300
Anmelder:United Technologies Corporation (0)
One Financial Plaza, Hartford, CT 06101, US
Erfinder:
Anmeldung:23.11.12
Offenlegung:30.12.11
Patenterteilung:15.04.20

Abstract / Hauptanspruch
A component inspection system, 22, comprises a sensor apparatus, 28, and a template, 24, having a component side, 54, and an opposing inspection side, 72. The inspection side, 72, includes a plurality of inspection bosses, 26-1, projecting therefrom, each of the plurality of inspection bosses, 26-1, having a first coupling, 82-1, and a sensor aperture, 30-1. Each aperture, 30-1, is disposed axially through each respective boss to the component side, 54, of the template. The sensor apparatus, 28, includes a receptacle for retaining a sensor, 50. The receptacle, 74, has a second coupling, 84, configured to individually engage with each of the plurality of first couplings, 82-1, for removably securing the sensor apparatus to a respective at least one of the plurality of inspection bosses.

EP2610578B1


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