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RESOLUTION ADAPTIVE MESH FOR PERFORMING 3-D METROLOGY OF AN OBJECT | AUFLÖSUNGSADAPTIVES GITTER ZUR AUSFÜHRUNG VON 3D-METROLOGIE EINES OBJEKTS | MAILLAGE ADAPTATIF À RÉSOLUTION POUR EFFECTUER UNE MÉTROLOGIE TRIDIMENSIONNELLE D'UN OBJET

Patentnummer:EP3435029B1
IPC Hauptklasse:G01B001124
Anmelder:
Erfinder:
Anmeldung:28.05.18
Offenlegung:28.07.17
Patenterteilung:06.11.19

Abstract / Hauptanspruch
A method for generating a resolution adaptive mesh for 3-D metrology of an object includes receiving point cloud data from a plurality of sensors. The point cloud data from each sensor defines a point cloud that represents the object. Each point cloud includes a multiplicity of points and each point includes at least location information for the point on the object. The method also includes determining a resolution of each sensor in each of three orthogonal dimensions based on a position of each sensor relative to the object and physical properties of each sensor. The method further includes generating a surface representation of the object from the point clouds using the resolutions of each sensor. The surface representation of the object includes a resolution adaptive mesh corresponding to the object for 3-D metrology of the object.

EP3435029B1


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