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Anmelder = SAMSUNG ELECTRONICS CO. LTD.


Erteilte Patente in der Einspruchsfrist

(DE B,C: 3 Monate nach Erteilung; EP B,C: 9 Monate nach Erteilung)

Patentschrift
Erteilung (Frist)
Anmelder
Titel der Erfindung (Arbeitstitel)
US10830577B2
10.11.20 (5)
CMOS image sensor for RGB imaging and depth measurement with laser sheet scan
SAMSUNG ELECTRONICS CO. LTD.
US10845220B2
24.11.20 (19)
Method of sensing rotation of rotation member and electronic device performing same
SAMSUNG ELECTRONICS CO. LTD.
US10866086B2
15.12.20 (41)
Structured-light projector and electronic apparatus including structured-light projector
SAMSUNG ELECTRONICS CO. LTD.
US10876832B2
29.12.20 (55)
Flexible apparatus and method for controlling operation thereof
SAMSUNG ELECTRONICS CO. LTD.
US10883822B2
05.01.21 (61)
CMOS image sensor for 2D imaging and depth measurement with ambient light rejection
SAMSUNG ELECTRONICS CO. LTD.
US10883821B2
05.01.21 (61)
CMOS image sensor for 2D imaging and depth measurement with ambient light rejection
SAMSUNG ELECTRONICS CO. LTD.
EP2848002B1
17.03.21 (134)
VORRICHTUNG UND VERFAHREN ZUR VERARBEITUNG VON 3D-INFORMATIONEN | APPAREIL ET PROCÉDÉ DE TRAITEMENT D'INFORMATIONS 3D | APPARATUS AND METHOD FOR PROCESSING 3D INFORMATION
SAMSUNG ELECTRONICS CO. LTD.
US10982954B2
20.04.21 (168)
Structured light projector and electronic apparatus including the same
SAMSUNG ELECTRONICS CO. LTD.
US10989520B2
27.04.21 (175)
Methods for nondestructive measurements of thickness of underlying layers
SAMSUNG ELECTRONICS CO. LTD.
US11002531B2
11.05.21 (190)
CMOS image sensor for RGB imaging and depth measurement with laser sheet scan
SAMSUNG ELECTRONICS CO. LTD.
US11041713B2
22.06.21 (229)
Nanostructured optical element, depth sensor, and electronic device
SAMSUNG ELECTRONICS CO. LTD.
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