patentverein.de - Patente
Patentethik
Überwachung
Beispielhaft
Trivial
Kurios
Unverständlich
Zurück Original-Dokument
Europäisches Patentamt

MEASUREMENT DEVICE WITH MULTIPLEXED POSITION SIGNALS | MESSVORRICHTUNG MIT GEMULTIPLEXTEN POSITIONSSIGNALEN | DISPOSITIF DE MESURE AVEC SIGNAUX DE POSITION MULTIPLEXÉS

Patentnummer:EP3182052B1
IPC Hauptklasse:G01B0005012
Anmelder:Mitutoyo Corporation (0)
20-1, Sakado 1-chome, ; Takatsu-ku, ; Kawasaki, Kanagawa 213-0012, JP
Erfinder:Harsila, Scott Allen (0)
20412 14th Drive S.E., Bothell WA Washington 98012, US
Sesko, David William (0)
15123 206th Avenue N.E., Woodinville WA Washington 98077, US
Anmeldung:14.12.16
Offenlegung:17.12.15
Patenterteilung:20.03.19

Abstract / Hauptanspruch
A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing X, Y and Z position signals. The X and Y position signals are indicative of a rotation of a stylus coupling portion about a rotation center, and the Z position signal is indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.

EP3182052B1


Kommentare zu diesem Patent schicken Sie bitte an .
Datenschutzerklärung