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Calibration method for a surface texture measuring instrument and said instrument | Kalibrationsverfahren für eine Vorrichtung zur Messung der Oberflächentextur und genannte Vorrichtung | Procédé de calibration pour un instrument pour mesurer la texture d'une surface et ledit instrument

Patentnummer:EP1475603B1
IPC Hauptklasse:G01B000500
Anmelder:Mitutoyo Corporation (0)
20-1, Sakado 1-chome, ; Takatsu-ku, ; Kawasaki, Kanagawa 213-0012, JP
Erfinder:
Anmeldung:04.05.04
Offenlegung:08.05.03
Patenterteilung:19.09.18

Abstract / Hauptanspruch
In a calibration method for a surface texture measuring instrument which measures the surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece surface, the calibration method includes a measurement step for measuring a calibration gauge the cross section of which contains a part of a substantially perfect circle, an assignment step for assigning the detection results from the measurement step in an evaluation formula based on the equation of a circle in which the center coordinates of the calibration gauge are (x c, zc) and the radius is "r", and a calibration step for calibrating each parameter based on the results obtained in the assignment step.

EP1475603B1


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