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POSITION/ORIENTATION MEASUREMENT METHOD, AND POSITION/ORIENTATION MEASUREMENT APPARATUS | POSITION/ORIENTATION MESSMETHODE UND POSITION/ORIENTATION MESSGERÄT | MÉTHODE DE MESURE DE POSITION/ORIENTATION, ET APPAREIL DE MESURE DE POSITION/ORIENTATION

Patentnummer:EP1437645B1
IPC Hauptklasse:G01B001100
Anmelder:
Erfinder:UCHIYAMA, Shinji (0)
c/o Canon Kabushiki Kaisha; 30-2, Shimomaruko 3-chome; Ohta-ku, Tokyo 146-8501, JP
Anmeldung:30.12.03
Offenlegung:10.01.03
Patenterteilung:04.07.18

Abstract / Hauptanspruch
A first error coordinate between the image coordinate of a first indicator, which is arranged on the real space and detected on a first image captured by a first image sensing unit, and the estimated image coordinate of the first indicator, which is estimated to be located on the first image in accordance with the position/orientation relationship between the first image sensing unit (with the position and orientation according to a previously calculated position/orientation parameter) and the first indicator, is calculated. On the other hand, a second error coordinate between the image coordinate of a second indicator, which is arranged on the first image sensing unit and detected on a second image that includes the first image sensing unit, and the estimated image coordinate of the second indicator, which is estimated to be located on the second image in accordance with the position/orientation relationship between the first image sensing unit (with the position and orientation according to the position/orientation parameter), and the second indicator, is calculated. Using the first and second error coordinates, the position/orientation parameter is corrected.

EP1437645B1


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