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METHOD AND APPARATUS FOR MEASURING THICKNESS OF AN OBJECT | VERFAHREN UND VORRICHTUNG ZUR MESSUNG DER DICKE EINES OBJEKTS | PROCÉDÉ ET APPAREIL POUR MESURER L'ÉPAISSEUR D'UN OBJET

Patentnummer:EP3032216B1
IPC Hauptklasse:G01B000506
Anmelder:
Erfinder:
Anmeldung:04.12.15
Offenlegung:12.12.14
Patenterteilung:01.11.17

Abstract / Hauptanspruch
An apparatus 100 for measuring thickness of an object is provided. The apparatus 100 includes a compression control system 200 which further includes a movable platform 210, a compression sensor 220, and a switching device 230 operatively coupled to the compression sensor 220. The apparatus 100 also includes a measurement system 290 operatively coupled to the switching device 230 for receiving a signal representative of a toggle event at the switching device 230 and configured to measure a gradient. The apparatus 100 also includes a processing circuit 300 operatively coupled to the switching device 230 and the measurement system 290 for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device 230 by using the gradient and a communication circuit 320 for transmitting a measured thickness of the object to a remote database 330.

EP3032216B1


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