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METHOD AND SYSTEM FOR DIMENSIONING AND IMAGING ITEMS | VERFAHREN UND SYSTEM ZUR DIMENSIONIERUNG UND ABBILDUNG VON GEGENSTÄNDEN | MÉTHODE ET SYSTÈME DE DIMENSIONNEMENT ET IMAGERIE D'OBJETS

Patentnummer:EP3118573B1
IPC Hauptklasse:G01B001100
Anmelder:
Erfinder:
Anmeldung:07.07.16
Offenlegung:16.07.15
Patenterteilung:15.11.17

Abstract / Hauptanspruch
Methods for dimensioning a 3D item are described. A FOV is mapped over three spatial dimensions, each of the three spatial dimensions oriented orthogonally in relation to each of the others and graduated according to a linear scale. The 3D item is scanned relative to the mapped FOV. Each of the 2D surfaces of the scanned 3D item is identified. A dimension is measured for each of the identified 2D surfaces of the scanned 3D item. A perspective-correct representation of the measured dimension is rendered, in real time or near real time, with respect to the measuring the dimension step, onto each of the identified 2D surfaces of the scanned 3D item.

EP3118573B1


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