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MEASURING PROBE | SONDE DE MESURE | MESSSONDE

Patentnummer:EP3064890B1
IPC Hauptklasse:G01B000500
Anmelder:Mitutoyo Corporation (0)
20-1, Sakado 1-chome, ; Takatsu-ku, ; Kawasaki, Kanagawa 213-0012, JP
Erfinder:Hidaka, Kazuhiko (0)
c/o Mitutoyo Research Center Europe B.V.; De Rijn 18, 5684 PJ Best, NL
Shimaoka, Atsushi (0)
c/o Mitutoyo Corporation; 20-1, Sakado 1-chome; Takatsu-ku, Kawasaki-shi Kanagawa 213-8533, JP
Anmeldung:03.07.15
Offenlegung:05.03.15
Patenterteilung:04.10.17

Abstract / Hauptanspruch
A measuring probe (300) includes a stylus(306) having a contact part(348) to be in contact with an object(W) to be measured, an axial motion mechanism(310) having a moving member(312) that allows the contact part(348) to move in an axial direction(O), and a rotary motion mechanism(334) having a rotating member(RP) that allows the contact part(348) to move along a plane perpendicular to the axial direction(O) by means of rotary motion. The measuring probe (300) includes a main body housing(308) that supports the axial motion mechanism(310), a module housing(330) that supports the rotary motion mechanism(334), and a displacement detector(328) supported by the main body housing(308) for detecting displacement of the moving member(312). The measuring probe (300) with this configuration ensures high measurement accuracy while keeping a low cost.

EP3064890B1


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