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Contour measuring apparatus | Appareil de mesure de contour | Konturmessvorrichtung

Patentnummer:EP2784440B1
IPC Hauptklasse:G01B002104
Anmelder:Mitutoyo Corporation (0)
20-1, Sakado 1-chome, ; Takatsu-ku, ; Kawasaki, Kanagawa 213-0012, JP
Erfinder:Hidaka, Hiroyuki (0)
Miyazaki, JP
Anmeldung:24.03.14
Offenlegung:25.03.13
Patenterteilung:25.10.17

Abstract / Hauptanspruch
A contour measuring apparatus includes: an arm (7) including a stylus (4) in a distal end (3) and being swingable with respect to a cabinet (6); an attitude change mechanism (8) configured to change an attitude of the arm (7) within a swing range; a stopper (15) configured to make contact with the arm (7) when the arm moves nearer to an installation part of an object to be measured within the swing range; and a controller (9) configured to operate the attitude change mechanism based on a power-off command and return the arm to a mechanical limit position in which the arm makes contact with the stopper.

EP2784440B1


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