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Anmelder = SAMSUNG ELECTRONICS CO. LTD.


Erteilte Patente in der Einspruchsfrist

(DE B,C: 3 Monate nach Erteilung; EP B,C: 9 Monate nach Erteilung)

Patentschrift
Erteilung (Frist)
Anmelder
Titel der Erfindung (Arbeitstitel)
US9879984B2
30.01.18 (7)
Optical scanning probe and apparatus for generating three-dimensional data using the same
SAMSUNG ELECTRONICS CO. LTD.
US9888565B2
06.02.18 (14)
Memory module and solid state drive having the same
SAMSUNG ELECTRONICS CO. LTD.
US9885589B2
06.02.18 (14)
Wheel circuit using electromagnetic induction and electronic pen including the same
SAMSUNG ELECTRONICS CO. LTD.
US9897554B2
20.02.18 (28)
Method of inspecting surface and method of inspecting photomask using the same
SAMSUNG ELECTRONICS CO. LTD.
US9921054B2
20.03.18 (58)
Shooting method for three dimensional modeling and electronic device supporting the same
SAMSUNG ELECTRONICS CO. LTD.
US9995648B2
12.06.18 (140)
Optical measurement system and method for measuring critical dimension of nanostructure
SAMSUNG ELECTRONICS CO. LTD.
US10012493B2
03.07.18 (162)
Device and method for detecting position of object
SAMSUNG ELECTRONICS CO. LTD.
US10060732B2
28.08.18 (217)
Flexible apparatus and method for controlling operation thereof
SAMSUNG ELECTRONICS CO. LTD.
US10072949B2
11.09.18 (231)
Method and device for measuring rotary input having a rotary member enclosing and rotating with respect to a main body including a first and a second region corresponding to a first and a second attribute
SAMSUNG ELECTRONICS CO. LTD.
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