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Anmelder = SAMSUNG ELECTRONICS CO. LTD.


Erteilte Patente in der Einspruchsfrist

(DE B,C: 3 Monate nach Erteilung; EP B,C: 9 Monate nach Erteilung)

Patentschrift
Erteilung (Frist)
Anmelder
Titel der Erfindung (Arbeitstitel)
US9995648B2
12.06.18 (53)
Optical measurement system and method for measuring critical dimension of nanostructure
SAMSUNG ELECTRONICS CO. LTD.
US10012493B2
03.07.18 (75)
Device and method for detecting position of object
SAMSUNG ELECTRONICS CO. LTD.
US10060732B2
28.08.18 (130)
Flexible apparatus and method for controlling operation thereof
SAMSUNG ELECTRONICS CO. LTD.
US10072949B2
11.09.18 (144)
Method and device for measuring rotary input having a rotary member enclosing and rotating with respect to a main body including a first and a second region corresponding to a first and a second attribute
SAMSUNG ELECTRONICS CO. LTD.
US10097741B2
09.10.18 (172)
Camera for measuring depth image and method of measuring depth image using the same
SAMSUNG ELECTRONICS CO. LTD.
US10119811B2
06.11.18 (200)
Alignment mark, method of measuring wafer alignment, and method of manufacturing a semiconductor device using the method of measuring wafer alignment
SAMSUNG ELECTRONICS CO. LTD.
Neuer Eintrag!
US10126146B2
13.11.18 (207)
Piezoelectric actuator and method of measuring motion by using the same
SAMSUNG ELECTRONICS CO. LTD.
Neuer Eintrag!
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