patentverein.de - Patente
Patentethik
Überwachung
Beispielhaft
Trivial
Kurios
Unverständlich

Anmelder = NIKON CORPORATION


Erteilte Patente in der Einspruchsfrist

(DE B,C: 3 Monate nach Erteilung; EP B,C: 9 Monate nach Erteilung)

Patentschrift
Erteilung (Frist)
Anmelder
Titel der Erfindung (Arbeitstitel)
US9857697B2
02.01.18 (11)
Pattern forming apparatus, mark detecting apparatus, exposure apparatus, pattern forming method, exposure method, and device manufacturing method
NIKON CORPORATION
US9891043B2
13.02.18 (53)
Profile measuring apparatus, structure manufacturing system, method for measuring profile, method for manufacturing structure, and non-transitory computer readable medium
NIKON CORPORATION
EP2573510B1
14.02.18 (54)
SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD | FORMMESSVORRICHTUNG UND FORMMESSVERFAHREN | DISPOSITIF DE MESURE DE FORME ET PROCÉDÉ DE MESURE DE FORME
NIKON CORPORATION
US9897437B2
20.02.18 (60)
Profile measuring apparatus, structure manufacturing system, method for measuring profile, method for manufacturing structure, and non-transitory computer readable medium
NIKON CORPORATION
US9921055B2
20.03.18 (90)
Shape measurement device, structure production system, shape measurement method, structure production method, and shape measurement program
NIKON CORPORATION
EP3023736B1
28.03.18 (98)
DEVICE, METHOD AND PROGRAM FOR SHAPE MEASUREMENT, AS WELL AS STRUCTURAL OBJECT PRODUCTION SYSTEM | VORRICHTUNG, VERFAHREN UND PROGRAMM ZUR FORMVERMESSUNG, SOWIE STRUKTUROBJEKTHERSTELLUNGSSYSTEM | DISPOSITIF, PROCÉDÉ ET PROGRAMME POUR LA MESURE DE FORME, AINSI QUE SYSTÈME DE PRODUCTION D'OBJET STRUCTUREL
NIKON CORPORATION
US9946160B2
17.04.18 (118)
Method for forming pattern and method for producing device
NIKON CORPORATION
US9945661B2
17.04.18 (118)
Method for measuring height, non-transitory computer readable medium storing a program for measuring height, and height measuring apparatus
NIKON CORPORATION
US9952038B2
24.04.18 (125)
Shape measurement device, structure production system, shape measurement method, structure production method, and shape measurement program
NIKON CORPORATION
US9971246B2
15.05.18 (147)
Exposure method, exposure apparatus, and device manufacturing method
NIKON CORPORATION
US9983028B2
29.05.18 (160)
Measurement method and encoder device, and exposure method and device
NIKON CORPORATION
Datenschutzerklärung